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Atomic JTAG Programming & Boundary Scan Testing

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產品介紹

AP-114 PRODUCT INFORMATION

The AP-114 Programmer provides a portable all-in-one solution for In-System Programming (ISP) of both JTAG and non-JTAG devices, Boundary Scan Testing and out of system device programming.

 Introduction
  •  
    • JTAG Programming & Testing

    • Boundary Scan Testing

    • Universal In-System Programming

    • EEPROM and SPI Flash Out-of-Circuit Programming

    • Generic GDB Proxy Server

    • Jennic JN51x8 JenNet Development Applications

    • Training Platform available
 Features
  • In-System Programmer for Serial Flash & EEPROMs, Atmel AVR, Microchip PIC, etc.

  • JTAG Programming, configuration and testing for all JTAG / IEEE 1149.1 compatible devices

  • Optional Boundary Scan Test software

  • Standalone Programming for SPI Flash and SPI, I2C & MicroWire serial EEPROMs

  • Generic GDB Proxy server - converts GDB messages into JTAG sequences

  • Optional cable for Jennic JN51x8 Wireless Microcontroller debugging (using JenNet stack)
  • Powerful and flexible user software includes ApPC and Infinity Express

  • SVF & STAPL(JAM) Player - plays STAPL, JAM, JBC, SVF files

  • DLL to add AP-114 to your own system

  • Built in Power supply from 1.8 to 3.3 Volts

  • Multi-programmer support - link 16 units together

  • Dual port headers support a range of JTAG pinouts, including Altera & Xilinx
 NXP/Jennic version
With an additional cable assembly, the AP-114 can be used to debug NXP/Jennic JN51x8 Wireless Microcontroller JenNet applications when used with software supplied by NXP/Jennic on their SDK JN-SW-4041. For full details see www.jennic.com.
 Portable Device Programmer
The AP-114 also works as a portable Universal In-System programmer for a range of ISP devices, which includes Altera EPCS & Xilinx config SPROMs, Microchip PIC, Atmel AVR plus other Microcontroller families which are added regularly. Out-of-system programming for 8-pin EEPROM & SPI Flash devices is also provided via plug-in adapter modules.
  • Built in Power supply from 1.8 to 3.3 Volts
  • Supported by APPC (Atomic Programming Center)
  • Stand-alone and ISP programming for
    • SPI serial EEPROMs
    • I2C serial EEPROMs
    • Microwire serial EEPROMs
    • SPI Flash
  • Plug-in adapter pods support a range of package options for stand-alone mode
    • PAJ-28DIP-1 : 8 pin DIP parts
    • PAJ-16SO-3 : 8 pin JEDEC SOIC parts
    • PAJ-16SO-4 : 8 pin EIAJ SOIC parts
 JTAG Boundary Scan
The optional Infinity SCAN Boundary Scan Test software is aimed at the diagnosis and debugging of complex PCB assemblies containing single or multiple embedded devices.

Using the boundary scan test protocol, individual pins of each device can be arbitrarily and safely monitored to determine their functionality. This operation can be carried out on static or active boards over a pre-defined period of time.

Information from a board can be stored and recalled by any user for simple verification of the device(s) on a chain (with pass/fail results) or deeper investigation using the graphical viewer and zoom features. Analysing this information can lead to the detection of :
  • Manufacturing defects (eg. Open circuit/shorted pins)
  • Logic errors (eg. pin failing to toggle/ faulty device)
  • Programme errors (eg. incorrect/corrupted program)
  • Faults in external circuitry (eg. missing or stuck input signal)

Automatic Functionality

The needs of a design engineer on a new project are different to those of a field engineer diagnosing a fault in-situ.

Therefore, various automatic functions and access levels are available with AP-114:
  • Automatic Chain Detection reduces the time consuming process of identifying devices.
  • Automatic Training lets the software learn the status of the board by itself (manual intervention is also possible)
  • Automatic Data Comparison for quick evaluation with pass/fail results

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